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Atomic Force Microscope (AFM)

AFM contact, AFM non-contact,A FM Force Modulation, AFM Atomic Resolution, LFM Lateral Force Microscopy (Friction), SKM / KPFM Scanning Kelvin Probe 

Microscopy (1pass, 2 pass), EFM Electrostatic Force, SCM Capacitance microscopy, MFM Magnetic Force, PFM Piezo Force, Nano-lithography, STM, C-AFM Conductive AFM, 

Atomic Force Microscope

Brand : Holiba

Model : AiST-NT